- Title
- High-speed vertical positioning for contact-mode atomic force microscopy
- Creator
- Fleming, Andrew J.
- Relation
- 2009 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Proceedings of the 2009 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (Singapore 14-17 July, 2009) p. 522-527
- Publisher Link
- http://dx.doi.org/10.1109/AIM.2009.5229959
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2009
- Description
- Many popular modes of scanning probe microscopy require a vertical feedback system to regulate the tip-sample interaction. Unfortunately the vertical feedback controller imposes a severe limit on the scan-speed of scanning probe microscopes. In this paper, the foremost bandwidth limitation is identified to be the low-frequency mechanical resonances of the scanner. To overcome this limitation, a dual-stage vertical positioner is proposed. In this work, the bandwidth of a contact-mode atomic force microscope is increased from 83 Hz to 2.7 kHz. This improvement allows image quality to be retained with a speed increase of 33 times, or alternatively, feedback error can be reduced by 33 times if scan speed is not increased.
- Subject
- bandwidth limitation; contact-mode atomic force microscopy; frequency 83 Hz to 2.7 kHz; high-speed vertical positioning; scanning probe microscopy; vertical feedback controller
- Identifier
- uon:8713
- Identifier
- http://hdl.handle.net/1959.13/918815
- Identifier
- ISBN:9781424428526
- Full Text
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